He, Yandong

Professor

Research Interests: Semiconductor device and circuit reliability

Office Phone: 86-10-6276 7915

Email: heyd@pku.edu.cn

He, Yandong is a professor in the Department of Microelectronics, School of Electronics Engineering and Computer Science, Peking University. She obtained her B.Sc. in electronics, M. Sc. and Ph.D. in solid-state electronics from Peking University, in 1990, 1993 and 2010 respectively. From 1997 to 1999, she was with Dept. of Electrical Engineering, National University of Singapore, working on the gate oxide reliability research. From 1999 to 2001, she was a Quality and Reliability Engineer Agilent Technologies Singapore Pte. Ltd., working on infrared and fiber optics transceiver device reliability evaluation, package process control and sub-contractor quality management. From 2001 to 2003, she was with Department of Technology and Development, Chartered Semiconductor Manufacturing Pte. Ltd. (now Global Foundries), working on the device and process integration for CMOS 130nm and 90nm FEOL process technology. Since 2003, she has been with Institute of Microelectronics, Peking University, where she was an associated professor and currently a processor. Her research interests include the characterization, physical mechanism analysis, modeling on the semiconductor electronic, optoelectronic device reliability, such as silicon CMOS devices and high-voltage/power devices; circuit design for reliability improvement based on dynamic monitoring and managing.

Dr. HE has authored and coauthored more than 50 technical papers on the referred international journals and conference proceedings. She is the holder of 12 national patents and 1 US patent. She has completed and done research in more than 10 state major research projects including 973 programs, NSFC, etc. She is a Member of IEEE Electron Devices Society, has served as peer-reviewers for several international journals including IEEE Transactions on Electron Devices, on Device and Materials Reliability, etc.